Analyst X

Analyst X

Scantech Instruments
STATUS 5

STATUS 5

Eclipse Scientific
+
+

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About

Analyst X is a high-performance data analysis software developed by ScanTech Instruments, designed for B-scan ultrasonic inspections in non-destructive testing applications. It offers automated reporting capabilities, allowing users to generate scan plans and B-scans with a single click, and supports the overlay of multiple B-scans for detailed comparative analysis. The software can produce data tables displaying high, average, and low values for each scan, and includes a re-gating function that enables post-collection adjustment of scan data to create smooth, clean scan maps. Automated statistical analysis on scan data is also available. Analyst X features a user-friendly interface with guided calibration to assist users through the calibration process and supports automated data acquisition, adjustable gain modification before or during scans, real-time data monitoring with immediate adjustment capabilities, and seamless pausing and resuming of scans.

About

STATUS 5 is a user-friendly software tool designed to assess the efficiency and reliability of non-destructive testing techniques and evaluate operator performance. It enables technicians, even those with limited statistical knowledge, to generate Probability of Detection (POD) curves, optimization plots, and summary tables through statistical analysis of imported data. The software supports various statistical models and offers an automated model recommendation based on the most efficient POD curve derived from the user's data. STATUS 5 includes noise study and threshold optimization tools to adjust POD model inputs based on inspection system properties, as well as sizing accuracy and optimization tools to calculate flaw sizing capabilities and provide guidance for optimizing calibration curves. The interface allows for quick importing and exporting of Excel documents or manual data entry.

Platforms Supported

Windows
Mac
Linux
Cloud
On-Premises
iPhone
iPad
Android
Chromebook

Platforms Supported

Windows
Mac
Linux
Cloud
On-Premises
iPhone
iPad
Android
Chromebook

Audience

Enterprises and organizations looking for a solution to manage their inspections and data analysis operations

Audience

NDT technicians seeking a solution to evaluate and enhance the reliability of their inspection systems

Support

Phone Support
24/7 Live Support
Online

Support

Phone Support
24/7 Live Support
Online

API

Offers API

API

Offers API

Screenshots and Videos

Screenshots and Videos

Pricing

No information available.
Free Version
Free Trial

Pricing

$8,300 one-time payment
Free Version
Free Trial

Reviews/Ratings

Overall 0.0 / 5
ease 0.0 / 5
features 0.0 / 5
design 0.0 / 5
support 0.0 / 5

This software hasn't been reviewed yet. Be the first to provide a review:

Review this Software

Reviews/Ratings

Overall 0.0 / 5
ease 0.0 / 5
features 0.0 / 5
design 0.0 / 5
support 0.0 / 5

This software hasn't been reviewed yet. Be the first to provide a review:

Review this Software

Training

Documentation
Webinars
Live Online
In Person

Training

Documentation
Webinars
Live Online
In Person

Company Information

Scantech Instruments
Founded: 1997
United States
scanndt.com/products/ndt-software/analyst-x-software-for-b-scanning/

Company Information

Eclipse Scientific
Canada
eclipsescientific.com/status.html

Alternatives

Analyst XR

Analyst XR

Scantech Instruments

Alternatives

Analyst X

Analyst X

Scantech Instruments
Analyst NDX

Analyst NDX

Scantech Instruments
DRIVE NDT

DRIVE NDT

DÜRR NDT
InspectionBank

InspectionBank

Eclipse Scientific
Analyst XR

Analyst XR

Scantech Instruments
STATUS 5

STATUS 5

Eclipse Scientific
CIVA

CIVA

EXTENDE

Categories

Categories

Integrations

Microsoft Excel

Integrations

Microsoft Excel
Claim Analyst X and update features and information
Claim Analyst X and update features and information
Claim STATUS 5 and update features and information
Claim STATUS 5 and update features and information